Yu Han is Professor of Chemical Science at KAUST, Saudi Arabia
High-resolution imaging of electron beam-sensitive crystalline materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with an extremely low beam dose, the time-constrained search for crystal zone axes, the precise alignment of successive images, and the accurate determination of the defocus value.
Yu Han is Professor of Chemical Science at KAUST, Saudi Arabia